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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Related Experiment Video

Updated: May 12, 2026

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
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High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Opportunities in high-speed atomic force microscopy.

Benjamin P Brown1, Loren Picco, Mervyn J Miles

  • 1Bristol Centre for Functional Nanomaterials, Centre for NSQI, University of Bristol, Tyndall Avenue, Bristol, BS8 1FD, UK.

Small (Weinheim an Der Bergstrasse, Germany)
|April 24, 2013
PubMed
Summary
This summary is machine-generated.

High-speed atomic force microscopy (AFM) now offers nanometer resolution imaging at video rates. This review explores HSAFM advancements and its potential for materials science applications.

Keywords:
AFM lithographyatomic force microscopyhigh-speed AFMscanning probe microscopysurface analysis

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Atomic Force Microscopy (AFM) is a standard research tool.
  • Commercial AFM imaging speeds are often slow, limiting applications.
  • High-speed AFM (HSAFM) instrumentation development began in the 1990s.

Purpose of the Study:

  • To review the development of high-speed AFM (HSAFM) instrumentation.
  • To highlight key discoveries made using HSAFM.
  • To discuss emerging applications of HSAFM in materials science.

Main Methods:

  • Review of HSAFM instrumentation advancements.
  • Summary of HSAFM imaging capabilities.
  • Exploration of HSAFM applications in materials science and lithography.

Main Results:

  • HSAFM now achieves nanometer resolution imaging at video rates.
  • HSAFM has been extensively used for biological samples.
  • HSAFM applications in materials science and lithography remain underexplored.

Conclusions:

  • HSAFM technology has matured significantly.
  • There is substantial untapped potential for HSAFM in materials science.
  • Further research can expand HSAFM's utility in diverse scientific fields.