Dephasing of electrons in the Aharonov-Bohm interferometer with a single-molecular vibrational junction

Phase relaxation of electrons transferring through an electromechanical transistor is studied using the Aharonov-Bohm interferometer. Using the quantum master equation approach, the phase properties of an electron are numerically analyzed based on the interference fringes. The coherence of the electron is partially destroyed by its scattering on excited levels of the local nanomechanical oscillator. The transmission amplitudes with respect to two adjacent mechanical vibrational levels have a phase difference of π. The character of the π phase shift depends on the oscillator frequency only and is robust over a wide range of values of the applied voltage, tunneling length and damping rate of the mechanical oscillator.