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Updated: May 11, 2026

Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps
Published on: August 17, 2017
Marco Califano1, Francisco M Gómez-Campos
1Institute of Microwaves and Photonics, School of Electronic and Electrical Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom. m.califano@leeds.ac.uk
We identified the unified origin of charge carrier trapping in semiconductor nanocrystals, a key issue hindering device performance. This discovery enables a universal strategy to suppress trapping and enhance technologies like solar cells and lasers.
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