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Mid-IR laser beam quality measurement through vanadium dioxide optical switching
S Bonora1, G Beydaghyan, A Haché
1CNR-INFM, Laboratory for Ultraviolet and X-ray Optical Research INFM-CNR, Padova, Italy. stefano.bonora@dei.unipd.it
Optics Letters
|May 2, 2013
Summary
We developed a new infrared laser characterization system using visible detectors. This system converts infrared to visible light, enabling broad spectral range measurements.
Area of Science:
- Optics and Photonics
- Materials Science
Background:
- Characterizing infrared lasers typically requires specialized infrared detectors.
- Existing methods for wavelength conversion often focus on visible-to-near-infrared applications.
Purpose of the Study:
- To present a novel beam characterization system for infrared lasers.
- To enable wavefront and beam profile measurements using visible detectors.
Main Methods:
- Exploiting wavelength conversion from infrared to visible light.
- Utilizing the optical switching and refractive index change of a vanadium dioxide (VO2) layer.
- Employing visible detectors for measurement.
Main Results:
- Successful demonstration of a beam characterization system for infrared lasers.
- The system measures both wavefront and beam profile.
- The technique is based on infrared-to-visible wavelength conversion.
Conclusions:
- The developed system offers a versatile method for infrared laser characterization.
- The technique leverages VO2 optical switching for wavelength conversion.
- Potential applicability across a broad spectral range, including visible, infrared, and terahertz frequencies.
