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Updated: May 11, 2026

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
Published on: August 22, 2017
Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge
C W Gayer1, D Hemmers, C Stelzmann
1Institut für Laser- und Plasmaphysik, Heinrich-Heine-Universität Düsseldorf, Düsseldorf 40225, Germany. christoph.gayer@hhu.de
Abstract:
We demonstrate the feasibility of measuring x-ray refractive indices by transparent edge diffraction without recourse to the Kramers-Kronig relations. The method requires a coherent x-ray source, a transparent sample with a straight edge, and a high resolution x-ray detector. Here, we use the aluminum Kα radiation originating from a laser-produced plasma to coherently illuminate the edge of thin aluminum and beryllium foils. The resulting diffraction patterns are recorded with an x-ray CCD camera. From least-squares fits of Fresnel diffraction modeling to the measured data we determine the refractive index of Al and Be at the wavelength of the Al Kα radiation (0.834 nm, 1.49 keV).
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