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Temperature-dependent electron mobility in InAs nanowires.

Nupur Gupta1, Yipu Song, Gregory W Holloway

  • 1Department of Physics and Astronomy, University of Waterloo, 200 University Avenue W., Waterloo, ON, Canada.

Nanotechnology
|May 2, 2013
PubMed
Summary
This summary is machine-generated.

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Electron mobility in Indium Arsenide (InAs) nanowire field-effect transistors was measured. Mobility increases with temperature up to 50 K, then decreases, explained by surface state scattering and nanoscale confinement effects.

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Nanotechnology

Background:

  • Indium Arsenide (InAs) nanowires are promising for electronic devices.
  • Understanding electron transport in nanowires is crucial for device performance.
  • Surface states significantly influence carrier mobility in low-dimensional systems.

Purpose of the Study:

  • To investigate the temperature dependence of electron mobility in InAs nanowire field-effect transistors (FETs).
  • To elucidate the scattering mechanisms limiting electron mobility.
  • To correlate transport measurements with theoretical models.

Main Methods:

  • Transport measurements on InAs nanowire FETs from 10 K to 200 K.
  • Analysis of mobility behavior with varying temperature.

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  • Finite-element simulations for scattering rate calculations.
  • Main Results:

    • Electron mobility increases with temperature below ~30-50 K and decreases above this range.
    • Observed mobility is explained by Coulomb scattering from ionized surface states.
    • Thermally activated scatterers and nanoscale confinement effects (interband scattering) influence mobility at higher temperatures.

    Conclusions:

    • Coulomb scattering from surface states is the dominant mechanism limiting InAs nanowire mobility.
    • Nanoscale confinement and subband population contribute to mobility variations at higher temperatures.
    • The study provides a comprehensive understanding of electron transport in InAs nanowires, crucial for device design.