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Updated: May 11, 2026

Characterization of Full Set Material Constants and Their Temperature Dependence for Piezoelectric Materials Using Resonant Ultrasound Spectroscopy
Published on: April 27, 2016
M Lilienblum1, A Hoffmann, E Soergel
1Department of Materials, ETH Zurich, Zurich, Switzerland. martin.lilienblum@mat.ethz.ch
This study demonstrates sub-room temperature piezoresponse force microscopy (PFM) for observing ferroelectric domain formation. The technique reveals temperature-dependent domain evolution in RbHSO4, advancing materials science research.
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