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Apparatus for measuring the Seebeck coefficients of highly resistive organic semiconducting materials
1State Key Laboratory of Transducer Technology, Institute of Electronics, Chinese Academy of Sciences, China. hycai@mail.ie.ac.cn
Abstract:
A Seebeck coefficient measurement apparatus for high resistance organic semiconductor materials has been designed and built. It can measure materials with resistance over 7 × 10(12) Ω. This is the highest material resistance value ever reported for Seebeck coefficient measurement. A cyclic temperature gradient generation technique and a corresponding algorithm are proposed to eliminate the negative effects of the long term drift of Seebeck voltage. Sources of errors in these measurements are discussed.
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