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Related Experiment Video

Updated: May 11, 2026

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies.

J Lubeck¹, B Beckhoff, R Fliegauf

¹Physikalisch-Technische Bundesanstalt, Berlin, Germany. janin.lubeck@ptb.de

The Review of Scientific Instruments

|May 3, 2013

Summary

This summary is machine-generated.

A new ultra-high vacuum instrument enhances nanoanalysis using synchrotron radiation. This versatile tool offers advanced X-ray techniques for detailed material characterization.

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Area of Science:

Materials Science
Nanotechnology
Analytical Chemistry

Background:

Advanced nanoanalysis requires sophisticated instrumentation for precise material characterization.
Synchrotron radiation offers unique properties for high-resolution elemental and structural analysis.

Purpose of the Study:

To construct and commission a novel ultra-high vacuum (UHV) instrument for X-ray reflectometry and spectrometry.
To enable versatile nanoanalytical techniques using synchrotron radiation for comprehensive material probing.

Main Methods:

Development of a UHV instrument featuring a 9-axis manipulator for independent sample alignment.
Integration of movable photodiodes and an aperture system for flexible beam control.
Utilization of energy-dispersive X-ray detectors for various analytical techniques.

Main Results:

The instrument successfully enables reference-free X-ray fluorescence analysis (XRF), total-reflection XRF, and grazing-incidence XRF.
Optional X-ray reflectometry and polarization-dependent X-ray absorption fine structure analyses are supported.
Analysis of sample composition, layer thickness, depth profiles, and molecular orientation for nanostructures is demonstrated.

Conclusions:

The newly developed UHV instrument provides a flexible and capable platform for advanced nanoanalysis.
It facilitates a wide range of X-ray-based techniques for detailed characterization of materials at the nanoscale.
The instrument's capabilities are validated through selected application examples.