Related Experiment Video
Updated: May 11, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Automatic crystallographic characterization in a transmission electron microscope: applications to twinning induced
M Galceran1, A Albou, K Renard
14MAT (Materials Engineering, Characterization, Synthesis and Recycling), Université Libre de Bruxelles, Avenue F.D. Roosevelt 50, 1050 Brussels, Belgium. mgalcera@ulb.ac.be
Abstract:
A new automated crystallographic orientation mapping tool in a transmission electron microscope technique, which is based on pattern matching between every acquired electron diffraction pattern and precalculated templates, has been used for the microstructural characterization of nondeformed and deformed aluminum thin films and twinning-induced plasticity steels. The increased spatial resolution and the use of electron diffraction patterns rather than Kikuchi lines make this tool very appropriate to characterize fine grained and deformed microstructures.
Related Concept Videos
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Determination of Crystal Structures
