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Universal electric-field-driven resistive transition in narrow-gap Mott insulators
Pablo Stoliar1, Laurent Cario, Etiene Janod
1Laboratoire de Physique des Solides, CNRS UMR 8502, Université Paris Sud, Bât 510, 91405 Orsay, France. pablo-alberto.stoliar@u-psud.fr
Universality in electric-field-driven resistive switching was observed in Mott systems. A new model explains this phenomenon as a dynamically directed avalanche, with verified accumulation and relaxation times.
Area of Science:
- Condensed matter physics
- Materials science
Background:
- Mott systems exhibit complex electronic behaviors.
- Resistive switching is a key phenomenon in electronic devices.
Purpose of the Study:
- To investigate the universality of electric-field-driven resistive switching in narrow-gap Mott systems.
- To develop a theoretical model explaining the observed resistive switching behavior.
Main Methods:
- Experimental investigation of three prototypical narrow-gap Mott systems.
- Development of a theoretical model based on Mott phenomenon features.
Main Results:
- A striking universality in electric-field-driven resistive switching was identified across the studied Mott systems.
- The developed model successfully reproduces the general behavior of resistive switching.
- The phenomenon is associated with a dynamically directed avalanche mechanism.
Conclusions:
- The study reveals a universal mechanism for resistive switching in narrow-gap Mott systems.
- The proposed model provides a theoretical framework for understanding this behavior.
- Predicted non-trivial accumulation and relaxation times were experimentally verified.
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