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Updated: May 11, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Impact of wave front and coherence optimization in coherent diffractive imaging
1Commissariat à l’Energie Atomique, Service des Photons, Atomes et Molécules, Bâtiment 522, Centre d’Etude de Saclay, 91191 Gif-sur-Yvette, France.
We achieved nanoscale imaging with a soft X-ray laser, reaching 78 nm resolution in a single shot. This demonstrates the critical role of beam quality in coherent diffractive imaging for high-fidelity nanoscale reconstructions.
Area of Science:
- Physics
- Materials Science
- Optics
Background:
- Coherent diffractive imaging (CDI) is a powerful lensless imaging technique.
- Achieving high spatial resolution in CDI often requires advanced X-ray sources and precise beam control.
Purpose of the Study:
- To demonstrate single-shot nanoscale imaging using a compact femtosecond soft X-ray laser.
- To investigate the impact of soft X-ray beam quality on phase retrieval and image fidelity in CDI.
Main Methods:
- Utilized a table-top femtosecond soft X-ray laser harmonic source operating at 32 nm wavelength.
- Recorded single-shot coherent diffraction patterns from nano-patterned slits.
- Analyzed the influence of X-ray beam properties (flux, wavefront, coherence) on the CDI process.
Main Results:
- Established that phase retrieval in CDI is highly sensitive to the quality of the X-ray beam.
- Quantified coherence and image fidelity using single-shot diffraction patterns.
- Achieved a final reconstructed image with a spatial resolution of 78 nm (half period) after optimizing beam characteristics.
Conclusions:
- Single-shot nanoscale imaging with high resolution is feasible using compact soft X-ray laser sources.
- Optimizing X-ray beam quality is crucial for successful phase retrieval and high-fidelity reconstructions in CDI.
- This technique offers a promising approach for ultrafast nanoscale characterization.
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