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Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
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Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron

A Béché1, J L Rouvière, J P Barnes

  • 1CEA-INAC/UJF-Grenoble UMR-E, SP2M, LEMMA, Minatec Grenoble F-38054, France. armand.beche@ua.ac.be

Ultramicroscopy
|May 16, 2013
PubMed

Keywords:
Convergent beam electron diffraction (CBED)Dark field electron holography (DFEH)High resolution scanning transmission electron microscopy (HRSTEM)High resolution transmission electron microscopy (HRTEM)Nano-beam electron diffraction (NBED or NBD)StrainTransmission electron microscopy

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