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Updated: May 11, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface
Z Majzik1, M Rachid Tchalala, M Svec
1Insitute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, Praha, 16200, Czech Republic. majzik@fzu.cz
Abstract:
In this paper, we present the first non-contact atomic force microscopy (nc-AFM) of a silicene on a silver (Ag) surface, obtained by combining non-contact atomic force microscopy and scanning tunneling microscopy (STM). STM images over large areas of silicene grown on the Ag(111) surface show both (√13 × √13)R13.9° and (4 × 4) superstructures. For the widely observed (4 × 4) structure, the observed nc-AFM image is very similar to the one recorded by STM. The structure resolved by nc-AFM is compatible with only one out of two silicon atoms being visible. This indicates unambiguously a strong buckling of the silicene honeycomb layer.

