Si isotopic structure of the infrared absorption of the fully hydrogenated vacancy in silicon

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Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
14:11

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

Published on: March 29, 2016

B Clerjaud1, B Pajot

  • 1UPMC Université Paris 06, UMR 7588, INSP, F-75005, Paris, France. bernard.clerjaud@upmc.fr

The Journal of Chemical Physics
|May 17, 2013
PubMed

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