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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Dattatray J Late1, Yi-Kai Huang, Bin Liu
1Department of Materials Science and Engineering, International Institute of Nanotechnology, Northwestern University, Evanston, Illinois 60208, USA. datta099@gmail.com
Few-layer molybdenum disulfide (MoS2) transistors show superior gas-sensing performance compared to single-layer devices. This study explores MoS2 layering for enhanced gas-solid interactions in sensors.
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