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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Contact Angle01:13

Contact Angle

When a solid is dipped inside a liquid, the liquid surface becomes curved near the contact. For some solid–liquid interfaces, the liquid is pulled up along the solid, while for others, the liquid surface is convex or depressed near the solid surface. This phenomenon can be explained using the concept of cohesive and adhesive forces.
The adhesive force is the molecular force between molecules of different materials, that is, between the molecules of the solid and the liquid. The cohesive force...

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Related Experiment Video

Updated: May 11, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

AFM tip effect on a thin liquid film.

R Ledesma-Alonso1, D Legendre, Ph Tordjeman

  • 1Institut de Mécanique des Fluides de Toulouse (IMFT), INPT-CNRS, Université de Toulouse, Allée du Professeur Camille Soula, 31400 Toulouse, France.

Langmuir : the ACS Journal of Surfaces and Colloids
|June 1, 2013
PubMed
Summary
This summary is machine-generated.

We explored how AFM probe interactions with liquid films depend on film thickness and probe size. Shallow films exhibit unique deformation behaviors, impacting optimal atomic force microscopy scanning conditions.

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Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
10:15

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

Related Experiment Videos

Last Updated: May 11, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
10:15

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

Area of Science:

  • Physics
  • Materials Science
  • Surface Science

Background:

  • Atomic Force Microscopy (AFM) is crucial for nanoscale surface analysis.
  • Understanding probe-liquid interactions is key for accurate measurements.
  • Liquid films present unique challenges due to their deformable nature.

Purpose of the Study:

  • To investigate the deformation of liquid films under an AFM probe.
  • To analyze the influence of physical and geometrical parameters, including film thickness (E), probe radius (R), and probe-surface distance (D).
  • To identify characteristic lengths and regimes governing film deformation and probe-liquid interactions.

Main Methods:

  • Numerical simulations of the Young-Laplace equation.
  • Consideration of probe/liquid and liquid/substrate interactions via Hamaker constants (Hpl, Hls).
  • Analysis of capillary forces (surface tension γ) and van der Waals attractions.

Main Results:

  • Two deformation regimes identified: bulk liquid (controlled by capillary length λC) and shallow film (controlled by characteristic length λF).
  • Characteristic film thicknesses (Eg, Eγ) define transitions between regimes.
  • Shallow films exhibit a localized tip effect with restricted deformation extent (λF).
  • Film thickness significantly affects the jump-to-contact distance (Dmin), which is probe radius-dependent for bulk and film-thickness-dependent for shallow films.

Conclusions:

  • The study elucidates distinct deformation behaviors of liquid films based on thickness.
  • Identified characteristic lengths and regimes provide insights into probe-liquid dynamics.
  • Results are crucial for optimizing AFM scanning parameters and interpreting results in liquid environments.