Phase Contrast and Differential Interference Contrast Microscopy
X-ray Imaging
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Updated: May 11, 2026

Phase Contrast and Differential Interference Contrast (DIC) Microscopy
Published on: August 6, 2008
Zhenwei Liu1, Danying Lin, Jianheng Huang
1Xi’an Institute of Optics and Precision Mechanics of CAS, Chinese Academy of Sciences, Xi’an 710119, China.
We introduce a novel x-ray microscopy technique using a biased derivative filter for enhanced differential phase contrast imaging. This method achieves nanometer-scale resolution, improving signal detection in x-ray microscopy applications.
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