Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: May 10, 2026

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

Evaluating focused ion beam induced damage in soft materials.

Russell J Bailey1, Remco Geurts, Debbie J Stokes

  • 1Department of Materials, School of Engineering and Materials Science, Queen Mary University of London, Mile End Road, London E1 4NS, United Kingdom.

Micron (Oxford, England : 1993)
|June 4, 2013
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

When ELIZA meets therapists: A Turing test for the heart and mind.

PLOS mental health·2026
Same author

Correction: When ELIZA meets therapists: A Turing test for the heart and mind.

PLOS mental health·2026
Same author

Accessing care: qualitative analysis of counseling center therapists' experiences of transitioning to telehealth.

Cogent mental health·2025
Same author

Corrective Experiencing as a Common Factor in Couple Therapy: Creating New and Positive Emotions in Relationships.

Family process·2025
Same author

Roadmap for Quantum Nanophotonics with Free Electrons.

ACS photonics·2025
Same author

Do therapists become more culturally humble with experience? Some humility is warranted.

Journal of counseling psychology·2025

Focused ion beam (FIB) microscopy affects polymer surfaces. Lower FIB energies increase stiffness due to gallium implantation, while higher energies yield results representative of the bulk material.

Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Focused ion beam (FIB) microscopy is crucial for material analysis and preparation.
  • Optimized FIB parameters for soft polymers remain underexplored.
  • Understanding FIB-induced surface modifications is essential for accurate material characterization.

Purpose of the Study:

  • To investigate the effects of varying focused ion beam (FIB) energies on the elastic modulus of polycarbonate surfaces.
  • To determine optimal FIB conditions for sectioning polymers with minimal surface alteration.

Main Methods:

  • Phase contrast Atomic Force Microscopy (AFM) was employed to measure local elastic modulus changes.
  • Energy Dispersive Spectroscopy (EDS) was used to analyze elemental composition and gallium (Ga+) implantation.
Keywords:
AFMDamageFIBPhase contrastPolymer

More Related Videos

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
10:22

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

Published on: June 16, 2014

Related Experiment Videos

Last Updated: May 10, 2026

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
11:03

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
10:22

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

Published on: June 16, 2014

  • Computer simulations were performed to model gallium ion concentration near the surface.

    • Main Results:

    • Polycarbonate surfaces exposed to lower FIB energies exhibited increased stiffness compared to the bulk material.
    • Higher FIB energies (up to 25keV) resulted in surfaces more representative of the bulk polycarbonate.
    • EDS confirmed gallium (Ga+) ion implantation as the cause of increased surface stiffness.
    • Simulations supported experimental findings, showing higher Ga+ concentration at lower FIB energies.

    Conclusions:

    • Higher energy focused ion beam (FIB) microscopy is less invasive for polymer sectioning.
    • Utilizing higher FIB energies (e.g., 25keV) preserves the bulk material properties of the polymer surface.
    • Gallium (Ga+) implantation significantly alters the mechanical properties of polymer surfaces under FIB exposure.