Translation position determination in ptychographic coherent diffraction imaging
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Updated: May 10, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Fucai Zhang1, Isaac Peterson, Joan Vila-Comamala
1London Centre for Nanotechnology, UCL, London, UK. fucai.zhang@ucl.ac.uk
Abstract:
Accurate knowledge of translation positions is essential in ptychography to achieve a good image quality and the diffraction limited resolution. We propose a method to retrieve and correct position errors during the image reconstruction iterations. Sub-pixel position accuracy after refinement is shown to be achievable within several tens of iterations. Simulation and experimental results for both optical and X-ray wavelengths are given. The method improves both the quality of the retrieved object image and relaxes the position accuracy requirement while acquiring the diffraction patterns.
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