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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Fucai Zhang1, Isaac Peterson, Joan Vila-Comamala
1London Centre for Nanotechnology, UCL, London, UK. fucai.zhang@ucl.ac.uk
Accurate ptychography imaging requires precise sample positioning. This study introduces a method to correct position errors during reconstruction, achieving sub-pixel accuracy and improving image quality for optical and X-ray applications.
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