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Updated: May 10, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

Application of dynamic displacement current for diagnostics of subnanosecond breakdowns in an inhomogeneous electric

Tao Shao1, Victor F Tarasenko, Cheng Zhang

  • 1Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing 100190, China. st@mail.iee.ac.cn

The Review of Scientific Instruments
|June 8, 2013
PubMed

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