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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which are...
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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Related Experiment Video

Updated: May 10, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Published on: June 13, 2023

Wide-area scanner for high-speed atomic force microscopy.

Hiroki Watanabe1, Takayuki Uchihashi, Toshihide Kobashi

  • 1Department of Physics, College of Science and Engineering, Kanazawa University, Kanazawa 920-1192, Japan.

The Review of Scientific Instruments
|June 8, 2013
PubMed
Summary
This summary is machine-generated.

High-speed atomic force microscopy (HS-AFM) now images larger samples. A new wide-area scanner enables visualization of dynamic processes in live cells with unprecedented scan ranges.

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Area of Science:

  • Biophysics
  • Microscopy
  • Nanotechnology

Background:

  • High-speed atomic force microscopy (HS-AFM) allows visualization of protein dynamics.
  • Current HS-AFM systems have limited scan ranges (~1x4 μm), restricting observation of larger biological samples like cells.

Purpose of the Study:

  • To develop a wide-area scanner for HS-AFM capable of imaging larger biological samples.
  • To overcome the limitations of existing HS-AFM scan ranges for observing cellular dynamics.

Main Methods:

  • A leverage mechanism was employed to magnify piezoelectric actuator displacements, creating a wide-area scanner with a ~46x46 μm scan range.
  • Feed-forward inverse compensation and rounded-vertex triangular scan signals were used to suppress vibrations from fast X-scanner movements.
  • Polynomial-approximation-based open-loop control was implemented to eliminate nonlinearity and hysteresis in piezoelectric actuator displacements and scanner interference.

Main Results:

  • The developed wide-area scanner achieved a maximum XY scan range of approximately 46x46 μm.
  • A scan speed of 6.3 mm/s in the X-direction was reached for scan sizes up to ~40 μm.
  • The system successfully demonstrated video imaging of dynamic processes in live bacterial and eukaryotic cells.

Conclusions:

  • The new wide-area scanner significantly expands the capabilities of HS-AFM for observing dynamic processes in live cells.
  • This advancement enables high-resolution, dynamic imaging of larger biological systems previously inaccessible to HS-AFM.
  • The developed technology opens new avenues for studying cellular mechanics and dynamics at the nanoscale.