Updated: May 10, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Jong-Ahn Kim1, Jae Wan Kim, Chu-Shik Kang
1Center for Length, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu, Daejeon 305-340, South Korea.
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A novel absolute planar position measurement method uses a 2D phase-encoded binary grating to achieve inherent nonlinearity error compensation. This technique enhances precision for nanometer-scale motion tracking and positioning systems.
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