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Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition

Jason Brown1, Paul Kocher, Chandra S Ramanujan

  • 1Clarendon Laboratory, Department of Physics, University of Oxford, Oxford OX1 3PU, United Kingdom.

Ultramicroscopy
|June 18, 2013
PubMed

Keywords:
AFM probesConducting AFMElectron-beam-induced deposition

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