Single defect center scanning near-field optical microscopy on graphene

Julia Tisler1, Thomas Oeckinghaus, Rainer J Stöhr

  • 13. Institute of Physics, Stuttgart University , 70550 Stuttgart, Germany.

Nano Letters
|June 26, 2013
PubMed
Summary

Researchers developed a scanning-probe microscope using a single nitrogen-vacancy (NV) center. This tool maps near-field coupling and demonstrates universal energy transfer scaling for atomic emitters and 2D materials.