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X-ray Imaging01:24

X-ray Imaging

German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with X-rays, and by 1900, X-ray was widely...
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X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
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Published on: October 9, 2012

High-precision x-ray polarimetry.

B Marx1, K S Schulze, I Uschmann

  • 1Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena, Germany. berit.marx@uni-jena.de

Physical Review Letters
|July 9, 2013
PubMed
Summary
This summary is machine-generated.

High-purity X-ray polarizers were developed using silicon crystals. These novel polarizers achieve unprecedented polarization purity for X-ray applications.

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Area of Science:

  • Physics
  • Crystallography

Background:

  • X-ray polarization purity is crucial for advanced scientific experiments.
  • Existing methods for achieving high polarization purity are limited.

Purpose of the Study:

  • To develop and demonstrate novel X-ray polarizers with significantly improved polarization purity.
  • To explore the application of these polarizers in measuring optical activity.

Main Methods:

  • Utilized channel-cut silicon crystals with six 90° reflections for X-ray polarization.
  • Tested the polarizers with 6.457- and 12.914-keV X-ray beams.
  • Measured the optical activity of a sucrose solution using the developed polarizers.

Main Results:

  • Achieved polarization purity levels of 2.4×10⁻¹⁰ for 6.457-keV X-rays.
  • Achieved polarization purity levels of 5.7×10⁻¹⁰ for 12.914-keV X-rays.
  • Successfully demonstrated the application in optical activity measurements.

Conclusions:

  • The developed silicon crystal polarizers offer a significant advancement in X-ray polarization purity.
  • These polarizers are suitable for sensitive measurements, including the optical activity of solutions.