Harnessing spectral property of dual wavelength white LED to improve vertical scanning interferometry

Wee Keat Chong1, Xiang Li, Yeng Chai Soh

  • 1Precision Measurement Group, Singapore Institute of Manufacturing Technology, 71 Nanyang Drive, Singapore 638075, Singapore. wkchong@simtech.a‑star.edu.sg

Applied Optics
|July 12, 2013
PubMed

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