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Related Experiment Video

Updated: May 9, 2026

Writing and Low-Temperature Characterization of Oxide Nanostructures
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Published on: July 18, 2014

Probing local ionic dynamics in functional oxides at the nanoscale.

Evgheni Strelcov1, Yunseok Kim, Stephen Jesse

  • 1Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States. strelcove@ornl.gov

Nano Letters
|July 20, 2013
PubMed
Summary

A new scanning probe microscopy method, FORC-IV, reveals local ionic dynamics in materials. This technique successfully separates electronic and ionic behaviors in Ca-substituted bismuth ferrite, offering nanoscale insights.

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Electrochemistry

Background:

  • Electrically active materials exhibit complex behaviors involving both electronic and ionic transport.
  • Understanding and differentiating these phenomena at the nanoscale is crucial for device development.
  • Current techniques may struggle to decouple these intertwined processes.

Purpose of the Study:

  • To introduce and validate a novel scanning probe microscopy technique, the first-order reversal curve current-voltage (FORC-IV) method.
  • To apply FORC-IV to Ca-substituted bismuth ferrite (Ca-BFO) to distinguish electronic and ionic contributions.
  • To investigate the temperature-dependent interplay of thermal and electric-field-driven resistance changes.

Main Methods:

  • Development and application of the first-order reversal curve current-voltage (FORC-IV) imaging mode.
  • Utilizing scanning probe microscopy for nanoscale probing.
  • Conducting variable-temperature measurements on Ca-BFO samples.

Main Results:

  • FORC-IV successfully separated electronic and ionic phenomena in Ca-BFO.
  • Spatial variability of electronic and ionic behaviors was visualized.
  • Variable-temperature studies highlighted the interplay between thermal and electric-field effects on resistance.

Conclusions:

  • FORC-IV is a versatile and powerful method for nanoscale electrochemical analysis.
  • Combined with electrochemical strain microscopy, FORC-IV can differentiate ferroelectric and ionic behaviors.
  • This technique advances the study of ionic dynamics in electrochemically active materials.