Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Basic considerations in the design of an electrostatic electron monochromator.

Ultramicroscopy·2025
Same author

In multi electron beam systems, "Neighbours Matter".

Ultramicroscopy·2023
Same author

Principles of electron wave front modulation with two miniature electron mirrors.

Ultramicroscopy·2021
Same author

Flat electron mirror.

Ultramicroscopy·2020
Same author

Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker.

Structural dynamics (Melville, N.Y.)·2019
Same author

Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopy.

Ultramicroscopy·2017

Related Experiment Video

Updated: May 9, 2026

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Integration of a high-NA light microscope in a scanning electron microscope.

A C Zonnevylle1, R F C Van Tol, N Liv

  • 1Department of Imaging Science and Technology, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg, the Netherlands.

Journal of Microscopy
|July 30, 2013
PubMed
Summary

We developed an integrated light-electron microscope for simultaneous high-resolution imaging. This novel correlative microscopy technique enables simultaneous optical and scanning electron microscopy on the same sample area.

Keywords:
Cathodoluminescence microscopycellular imagingcorrelative microscopyfluorescence microscopylight microscopyscanning electron microscopy

More Related Videos

Workflow Using a Cryogenic Coincident Fluorescence, Electron, and Ion Beam Microscope for Targeted Milling of Cells
08:29

Workflow Using a Cryogenic Coincident Fluorescence, Electron, and Ion Beam Microscope for Targeted Milling of Cells

Published on: October 17, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Related Experiment Videos

Last Updated: May 9, 2026

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Workflow Using a Cryogenic Coincident Fluorescence, Electron, and Ion Beam Microscope for Targeted Milling of Cells
08:29

Workflow Using a Cryogenic Coincident Fluorescence, Electron, and Ion Beam Microscope for Targeted Milling of Cells

Published on: October 17, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Area of Science:

  • Correlative microscopy
  • Nanotechnology
  • Materials Science

Background:

  • Simultaneous imaging with light and electron microscopy is challenging.
  • Existing methods often lack precise alignment and high resolution.

Purpose of the Study:

  • To present an integrated light-electron microscope for simultaneous high-resolution imaging.
  • To enable correlative light and electron microscopy on the same sample area.

Main Methods:

  • An inverted high-numerical aperture (NA) objective lens was integrated inside a scanning electron microscope (SEM).
  • The light and SEM objective lenses share a common axis and focal plane.
  • In situ epifluorescence microscopy with a NA of 1.4 was performed using vacuum-compatible immersion oil.

Main Results:

  • Simultaneous high-resolution optical and scanning electron microscopy was achieved.
  • Precise alignment of fields of view was demonstrated (sub-10 μm).
  • A 40-nm fluorescent nanoparticle showed a full width at half maximum (FWHM) of 380 nm, with uncompromised SEM performance.

Conclusions:

  • The integrated instrument offers new possibilities for correlative light and electron microscopy.
  • This technique is applicable to life sciences, physics, and chemistry.
  • The system provides flexibility in light microscope component mounting.