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Related Experiment Video

Updated: May 9, 2026

Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy

Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy

Published on: July 18, 2014

Counting elementary charges on nanoparticles by electron holography.

C Gatel¹, A Lubk, G Pozzi

¹CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, 31055 Toulouse, France. gatel@cemes.fr

Physical Review Letters

|July 30, 2013

Summary

Aberration-corrected electron holography precisely counts charge on individual nanoparticles. This new method applies Gauss

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High Resolution Physical Characterization of Single Metallic Nanoparticles

High Resolution Physical Characterization of Single Metallic Nanoparticles

Published on: June 28, 2019

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Last Updated: May 9, 2026

Quantitative and Qualitative Examination of Particle-particle Interactions Using Colloidal Probe Nanoscopy

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Published on: July 18, 2014

High Resolution Physical Characterization of Single Metallic Nanoparticles

High Resolution Physical Characterization of Single Metallic Nanoparticles

Published on: June 28, 2019

Area of Science:

Nanoscale science and technology
Applied physics
Materials science

Background:

Quantifying charge at the nanoscale is crucial for advanced electronic devices and nanomaterials.
Existing methods lack the precision to measure charge on individual nanoparticles.

Purpose of the Study:

To develop and validate a high-precision method for quantifying charge on individual nanoparticles.
To establish a nanoscale charge measurement technique using electron holography.

Main Methods:

Utilizing aberration-corrected electron holography for charge measurement.
Applying Gauss's law within predefined nanoscale contours to quantify charge.
Performing statistical analysis to correlate measurement precision with contour size.

Main Results:

Demonstrated the capability to count charge on individual nanoparticles with a precision of one elementary charge.
Established a direct relationship between contour size and charge measurement precision.
Identified strategies for optimizing spatial and signal resolution in nanoscale charge measurements.

Conclusions:

Aberration-corrected electron holography offers an unprecedented capability for nanoscale charge quantification.
The presented method provides a direct and precise way to measure charge distribution at the nanoparticle level.
This technique is vital for advancing research and development in nanotechnology and electronic devices.