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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

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Computational investigation of electron path inside SEM chamber in mirror effect phenomenon

Hassan N Al-Obaidi1, Imad H Khaleel

  • 1Department of Physics, College of Education Al-Mustansiriyah University, Baghdad, Iraq. hassanmail2006@yahoo.com

Micron (Oxford, England : 1993)
|July 31, 2013
PubMed

Keywords:
Charge particle opticsMirror effect phenomenaScanning electron microscope

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