Atomic Emission Spectroscopy: Lab
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences
Atomic Emission Spectroscopy: Instrumentation
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Updated: May 9, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
1Sandia National Laboratories, PO Box 5800, Albuquerque, New Mexico 87185, USA. bmjones@sandia.gov
A basis set expansion method recovers plasma radiation source information from transformed instrument data. This technique is applied to x-ray images from wire array implosions and neutron time-of-flight data from deuterium gas puff z pinches.
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