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Related Experiment Videos

Scanning image detection (SID) system for conventional transmission electron microscope (CTEM) images.

T Tanji1, M Tomita, H Kobayashi

  • 1Research Institute for Scientific Measurements Tohoku University, Sendai, Japan.

Journal of Electron Microscopy Technique
|August 1, 1990
PubMed
Summary
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A novel transmission electron microscope (TEM) imaging system displays images on a CRT without a camera. This new scanning TEM (STEM) method achieves 1 nm spatial resolution.

Area of Science:

  • Microscopy
  • Electron Optics
  • Image Detection Systems

Background:

  • Conventional transmission electron microscopes (CTEM) typically require video camera systems for image display.
  • Existing scanning TEM (STEM) instruments often involve complex setups.

Purpose of the Study:

  • To develop a new image detection system for transmission electron microscopes (TEM).
  • To enable direct display of TEM images on a cathode ray tube (CRT) without a video camera.
  • To achieve high spatial resolution in the generated images.

Main Methods:

  • Utilized deflection coils in the objective and intermediate lenses to scan a small electron probe.
  • Employed an improved scintillator and photomultiplier to acquire electrical signals.
  • Synchronized the acquired signal with the scanning signal for display.

Related Experiment Videos

  • Integrated the system with a 100 kV conventional TEM (CTEM) featuring a hairpin-type electron gun.

    • Main Results:

    • Successfully displayed transmission electron microscope (TEM) images on a CRT.
    • The system operated without an external video camera.
    • Achieved a spatial resolution of 1 nm in preliminary tests.
    • The image display mimicked the functionality of a conventional scanning TEM (STEM) instrument.

    Conclusions:

    • The developed system offers a viable alternative for TEM image display.
    • Eliminating the need for a video camera simplifies the TEM setup.
    • The achieved 1 nm resolution demonstrates the potential of this novel approach for high-detail imaging.