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Thermal mapping of a scanning thermal microscopy tip
Grzegorz Jóźwiak1, Grzegorz Wielgoszewski, Teodor Gotszalk
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, ul. Z. Janiszewskiego 11/17, PL-50372 Wrocław, Poland.
Ultramicroscopy
|August 13, 2013
Summary
Scanning thermal microscopy (SThM) probes are shrinking for better nanoelectronics measurements. A new tip thermal mapping (TThM) method assesses probe-sample thermal contact quality for more accurate results.
Area of Science:
- Nanotechnology
- Materials Science
- Surface Science
Background:
- Scanning thermal microscopy (SThM) is crucial for analyzing thermal properties of nanostructures.
- Miniaturization of SThM probes enhances measurement localization for nanoelectronics applications.
- Assessing thermal contact quality is vital for quantitative SThM measurements.
Purpose of the Study:
- To introduce a novel tip thermal mapping (TThM) procedure.
- To experimentally estimate the power dissipation distribution of SThM probe tips.
- To validate the TThM procedure's utility in quantitative SThM.
Main Methods:
- Development of a tip thermal mapping (TThM) procedure.
- Experimental estimation of power dissipation on SThM probe tips.
- Modeling of power dissipation for active-mode SThM analysis.
Main Results:
- The TThM procedure provides an experimental method to assess probe-sample thermal contact.
- The proposed power dissipation model successfully explains active-mode SThM measurement outcomes.
- The TThM procedure demonstrates reversibility for specific probe-sample combinations.
Conclusions:
- The TThM procedure is a valuable tool for improving the accuracy of SThM measurements.
- Understanding power dissipation is key to reliable quantitative thermal analysis at the nanoscale.
- This work advances the application of SThM in nanoelectronics and nanotechnology research.
Keywords:
A-SThMAFMActive-mode scanning thermal microscopyAtomic force microscopyBTRBlind tip reconstructionP-SThMPassive-mode scanning thermal microscopyRBTRRegularized blind tip reconstructionSPMSThMScanning probe microscopyScanning thermal microscopySurface distribution of dissipated powerTThMTip thermal mapping
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