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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Slope efficiency and spurious-free dynamic range of silicon Mach-Zehnder modulator upon carrier depletion and

Xianshu Luo1, Xiaoguang Tu, Junfeng Song

  • 1Institute of Microelectronics, Agency for Science, Technology and Research, 11 Science Park Road, Science Park II, 117685 Singapore. luox@ime.a-star.edu.sg

Optics Express
|August 14, 2013
PubMed

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