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Fitting freeform shapes with orthogonal bases.

G W Forbes1

  • 1QED Technologies Inc., 1040 University Avenue, Rochester, NY 14607, USA. forbes@qedmrf.com

Optics Express
|August 14, 2013
PubMed
Summary
This summary is machine-generated.

This study introduces an efficient method for analyzing freeform shapes using orthogonal polynomials and Fourier transforms. The technique effectively quantifies and filters mid-spatial frequency structures in manufactured parts.

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Area of Science:

  • Optics and optical engineering
  • Metrology
  • Computational geometry

Background:

  • Accurate characterization of freeform optical surfaces is crucial for performance.
  • Existing methods for analyzing mid-spatial frequency errors can be computationally intensive.
  • Fitting arbitrary shapes requires robust mathematical frameworks.

Purpose of the Study:

  • To develop an efficient analytical method for fitting freeform shapes using orthogonal polynomials.
  • To enable precise quantification and filtering of mid-spatial frequency errors in optical components.
  • To leverage orthogonality for improved metrology of as-built parts.

Main Methods:

  • Exploitation of orthogonality for fitting analytically-specified freeform shapes.
  • Representation of shapes using orthogonal polynomials.
  • Coupling of Fast Fourier Transforms (FFTs) with Gaussian quadrature for analysis.
  • Application to measurements of as-built parts with circular domains.

Main Results:

  • An explicit and efficient formulation for fitting freeform shapes was derived.
  • The method allows for the use of an arbitrary number of polynomial terms.
  • Successful quantification and filtering of mid-spatial frequency structures were demonstrated.
  • The approach is applicable to real-world measurements of manufactured optical components.

Conclusions:

  • The developed method provides an efficient and accurate approach for freeform surface metrology.
  • Orthogonal polynomial fitting combined with FFTs offers a powerful tool for error analysis.
  • This technique facilitates improved quality control and understanding of mid-spatial frequencies in optical manufacturing.