Phase aberration compensation in digital holographic microscopy based on principal component analysis
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Updated: May 8, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Chao Zuo1, Qian Chen, Weijuan Qu
1Jiangsu Key Laboratory of Spectral Imaging & Intelligence Sense, Nanjing University of Science and Technology, Nanjing, Jiangsu Province, China. surpasszuo@163.com
Abstract:
We present an effective, fast, and straightforward phase aberration compensation method in digital holographic microscopy based on principal component analysis. The proposed method decomposes the phase map into a set of values of uncorrelated variables called principal components, and then extracts the aberration terms from the first principal component obtained. It is effective, fully automatic, and does not require any prior knowledge of the object and the setup. The great performance and limited computational complexity make our approach a very attractive and promising technique for compensating phase aberration in digital holography under time-critical environments.
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