A computational study of spike time reliability in two types of threshold dynamics

Spike time reliability (STR) refers to the phenomenon in which repetitive applications of a frozen copy of one stochastic signal to a neuron trigger spikes with reliable timing while a constant signal fails to do so. Observed and explored in numerous experimental and theoretical studies, STR is a complex dynamic phenomenon depending on the nature of external inputs as well as intrinsic properties of a neuron. The neuron under consideration could be either quiescent or spontaneously spiking in the absence of the external stimulus. Focusing on the situation in which the unstimulated neuron is quiescent but close to a switching point to oscillations, we numerically analyze STR treating each spike occurrence as a time localized event in a model neuron. We study both the averaged properties as well as individual features of spike-evoking epochs (SEEs). The effects of interactions between spikes is minimized by selecting signals that generate spikes with relatively long interspike intervals (ISIs). Under these conditions, the frequency content of the input signal has little impact on STR. We study two distinct cases, Type I in which the f-I relation (f for frequency, I for applied current) is continuous and Type II where the f-I relation exhibits a jump. STR in the two types shows a number of similar features and differ in some others. SEEs that are capable of triggering spikes show great variety in amplitude and time profile. On average, reliable spike timing is associated with an accelerated increase in the "action" of the signal as a threshold for spike generation is approached. Here, "action" is defined as the average amount of current delivered during a fixed time interval. When individual SEEs are studied, however, their time profiles are found important for triggering more precisely timed spikes. The SEEs that have a more favorable time profile are capable of triggering spikes with higher precision even at lower action levels.