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Nondestructive method for quantifying thallium dopant concentrations in CsI:Tl crystals.

Stuart R Miller¹, Elena E Ovechkina, Paul Bennett

¹Radiation Monitoring Devices Inc., 44 Hunt Street Watertown, MA 02472, USA.

Applied Radiation and Isotopes : Including Data, Instrumentation and Methods for Use in Agriculture, Industry and Medicine

|August 29, 2013

Summary

We developed a quantitative X-ray fluorescence (XRF) method to measure thallium (Tl) in cesium iodide (CsI:Tl) scintillators. This technique accurately determines Tl content, crucial for scintillator performance and applicable to other dopants.

Keywords:

CsI:Tl Nondestructive testing Thallium concentration X-ray fluorescence XRF

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Area of Science:

Materials Science
Analytical Chemistry
Nuclear Instrumentation

Background:

Cesium iodide doped with thallium (CsI:Tl) is a widely used scintillator material.
Accurate quantification of thallium (Tl) dopant concentration is critical for optimizing CsI:Tl scintillator performance.
Existing methods for dopant analysis may be destructive or lack precision.

Purpose of the Study:

To establish a non-destructive quantitative method for measuring Tl content in CsI:Tl scintillators.
To investigate the influence of crystal size and growth parameters on Tl concentration.
To demonstrate the broader applicability of the developed method to other scintillator activator ions.

Main Methods:

Utilized a handheld X-ray fluorescence (XRF) instrument (LeadTracer™).
Developed a quantitative measurement technique for Tl in CsI:Tl samples.
Analyzed variations in Tl concentration based on crystal dimensions and fabrication parameters.

Main Results:

Successfully implemented a non-destructive XRF method for accurate Tl quantification in CsI:Tl.
Observed correlations between crystal size, growth conditions, and Tl dopant levels.
Validated the method's potential for analyzing other activator ions like Ce(3+) and Eu(2+).

Conclusions:

The developed XRF technique provides a reliable and non-destructive means to measure Tl content in CsI:Tl scintillators.
Understanding the impact of crystal parameters on dopant concentration is essential for scintillator material development.
This versatile XRF approach can be extended to quantify other critical dopants in various scintillator materials.