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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Conductance fluctuations in semiconductor nanostructures

Bobo Liu1, R Akis, D K Ferry

  • 1School of Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ 85287, USA.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|September 4, 2013
PubMed

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