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Related Concept Videos

Carrier Generation and Recombination01:22

Carrier Generation and Recombination

Carrier generation is the process by which electron-hole pairs (EHPs) are created within the semiconductor. In direct-bandgap semiconductors, such as gallium arsenide (GaAs), this occurs efficiently when energy absorption prompts valence electrons to leap into the conduction band, leaving behind holes.
This process is given by the generation rate G and is efficient due to the conservation of momentum between the valence band maximum and conduction band minimum.
Indirect generation involves an...
Semiconductors01:22

Semiconductors

There is variation in the electrical conductivity of materials - metals, semiconductors, and insulators that are showcased with the help of the energy band diagrams.
Metals such as copper (Cu), zinc (Zn), or lead (Pb) have low resistivity and feature conduction bands that are either not fully occupied or overlap with the valence band, making a bandgap non-existent. This allows electrons in the highest energy levels of the valence band to easily transition to the conduction band upon gaining...
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Metal-Semiconductor Junctions

The contact of metal and semiconductor can lead to the formation of a junction with either Schottky or Ohmic behavior.
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The semiconductor's...
Types of Semiconductors01:20

Types of Semiconductors

Intrinsic semiconductors are highly pure materials with no impurities. At absolute zero, these semiconductors behave as perfect insulators because all the valence electrons are bound, and the conduction band is empty, disallowing electrical conduction. The Fermi level is a concept used to describe the probability of occupancy of energy levels by electrons at thermal equilibrium. In intrinsic semiconductors, the Fermi level is positioned at the midpoint of the energy gap at absolute zero. When...
P-N junction01:11

P-N junction

A p-n junction is formed when p-type and n-type semiconductor materials are joined together. At the interface of the p-n junction, holes from the p-side and electrons from the n-side begin to diffuse into the opposite sides due to the concentration gradient. This diffusion of carriers leads to a region around the junction where there are no free charge carriers, known as the depletion region. The charge density within the depletion region for the n-side and p-side can be described by the...
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Imperfections in Crystal Structure: Stoichiometric Point Defects

Schottky defects arise when some lattice points in a crystal, such as those in NaCl, remain unoccupied, creating lattice vacancies without disturbing the overall electrical neutrality of the crystal. This defect is common in ionic crystals where the positive and negative ions are similar in size, as seen in sodium chloride and cesium chloride. The presence of Schottky defects enables the crystal to conduct electricity to a small extent through an ionic mechanism. Electric fields cause nearby...

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Communication: Non-radiative recombination via conical intersection at a semiconductor defect.

Yinan Shu1, Benjamin G Levine

  • 1Department of Chemistry, Michigan State University, East Lansing, Michigan 48824, USA.

The Journal of Chemical Physics
|September 7, 2013
PubMed
Summary

Semiconductor defects can trigger non-radiative (NR) decay, leading to energy loss. This study simulates NR decay via conical intersection at a silicon epoxide defect, potentially quenching photoluminescence (PL) in silicon nanocrystals.

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Area of Science:

  • Materials Science
  • Physical Chemistry
  • Computational Chemistry

Background:

  • Electronic excitations in semiconductors can localize at defects, often preceding energy dissipation via non-radiative (NR) decay.
  • Many molecular systems are known to undergo NR decay through conical intersections, a process critical for understanding photophysical pathways.

Purpose of the Study:

  • To directly simulate the fast and efficient non-radiative decay process occurring at a specific semiconductor defect.
  • To investigate the role of a silicon epoxide defect in the photoluminescence (PL) of silicon nanocrystals.

Main Methods:

  • Direct simulation of electronic excitation dynamics.
  • Computational modeling of conical intersection pathways in semiconductor defects.

Main Results:

  • Successfully simulated fast and efficient non-radiative decay via a conical intersection at a silicon epoxide defect.
  • The silicon epoxide defect is proposed to selectively quench photoluminescence in silicon nanocrystals with band gaps exceeding approximately 2.8 eV.

Conclusions:

  • The silicon epoxide defect acts as a critical site for non-radiative decay in silicon nanocrystals.
  • This defect influences both the yield and energy of photoluminescence in oxidized silicon nanocrystals, impacting their optical properties.