Related Experiment Video
Updated: May 8, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Correction of nonlinear lateral distortions of scanning probe microscopy images
M Schnedler1, P H Weidlich, V Portz
1Peter Grünberg Institut, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.
Abstract:
A methodology for the correction of scanning probe microscopy image distortions is demonstrated. It is based on the determination of displacement vectors from the measurement of a calibration sample. By moving the pixels of the distorted scanning probe microscopy image along the displacement vectors an almost complete correction of the nonlinear, time independent distortions is achieved.
More Related Videos
05:04Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
12:18Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
Published on: June 27, 2022
Related Concept Videos
NMR Spectrometers: Resolution and Error Correction
Overview of Microscopy Techniques
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...