Schottky Barrier Diode
Diode: Forward bias
Modeling of Diode Forward Characteristics
Modeling of Diode Reverse Characteristics
The Ideal Diode
Diode: Reverse bias
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
O A Madrid González1, T Rivera Montalvo
1Centro de investigación en Ciencia Aplicada y Tecnología Avanzada-Legaría del Instituto Politécnico Nacional, Legaría 694. Colonia Irrigación, 11500 México D.F.
This study characterized a semiconductor diode using a 4 MeV electron beam for dosimetry. Results show its suitability for total skin electron therapy (TSET) treatment control.
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