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Fabrication and Optimization of Type II Silicon Clathrate Films
Published on: October 14, 2025
V Romaka1, V Fosodeder, P F Rogl
1Institute of Physical Chemistry, University of Vienna , Währingerstrasse 42, A-1090 Wien, Austria.
This study reveals the crystal structure of a new silicon boride, Ta7Si2(Si(x)B(1-x))2, using X-ray diffraction. DFT calculations confirm its covalent-ionic nature and high hardness, indicating metallic behavior.
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