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Updated: May 7, 2026

Atomically Traceable Nanostructure Fabrication
Published on: July 17, 2015
Scott C Brown1, Volodymyr Boyko, Greg Meyers
1Corporate Center for Analytical Sciences, DuPont Central Research and Development, Wilmington, Delaware, USA.
Current challenges in nanomaterial metrology hinder regulatory efforts. Harmonized methods are needed for accurate size and count identification to support sustainable nanotechnology development.
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Published on: October 20, 2020
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