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Updated: May 7, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

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Advanced nanocluster ion source based on high-power impulse magnetron sputtering and time-resolved measurements of

Chuhang Zhang1, Hironori Tsunoyama, Hiroki Akatsuka

  • 1Nakajima Designer Nanocluster Assembly Project, JST-ERATO , 3-2-1 Sakado, Takatsu-ku, Kawasaki 213-0012, Japan.

The Journal of Physical Chemistry. A
|October 2, 2013
PubMed

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