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Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...
Atomic Absorption Spectroscopy: Instrumentation01:22

Atomic Absorption Spectroscopy: Instrumentation

An atomic absorption spectrophotometer (AAS) comprises several components: a radiation source, an atomizer, a monochromator, and a detector. The radiation source can be a hollow-cathode lamp (HCL) or an electrodeless-discharge lamp (EDL), both of which provide a narrow emission line of the required wavelength. However, some instruments use continuum sources and high-resolution monochromators to achieve a narrow range of radiation.
The atomizer used in AAS can be either a flame atomizer or an...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
UV–Vis Spectrometers01:14

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

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High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis
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High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis

Published on: December 22, 2015

Avoiding the side-effect of high-performance spectrometers with coded apertures.

Mingbo Chi, Peng Hao, Yihui Wu

    Applied Optics
    |October 3, 2013
    PubMed
    Summary
    This summary is machine-generated.

    A novel coded aperture spectrometer uses microelectromechanic system technology for high-resolution spectral analysis. This advanced spectrometer overcomes manufacturing errors to improve wavelength accuracy in spectral measurements.

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    Published on: May 18, 2011

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    Rejection of Fluorescence Background in Resonance and Spontaneous Raman Microspectroscopy
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    Rejection of Fluorescence Background in Resonance and Spontaneous Raman Microspectroscopy

    Published on: May 18, 2011

    Area of Science:

    • Spectroscopy
    • Optical Engineering
    • Microelectromechanical Systems (MEMS)

    Background:

    • Traditional spectrometers often use single slits, limiting resolution and signal-to-noise ratio.
    • Microelectromechanic system (MEMS) technology offers potential for miniaturization and enhanced optical component fabrication.
    • Manufacturing errors in optical components can significantly impact instrument performance and accuracy.

    Purpose of the Study:

    • To introduce a high-resolution, high-signal-to-noise coded aperture spectrometer utilizing MEMS technology.
    • To describe the encoding/decoding principles and instrument structure.
    • To address and mitigate the impact of manufacturing errors on wavelength accuracy.

    Main Methods:

    • Replaced traditional single slits with 2D array slits fabricated using MEMS technology.
    • Detailed the encoding and decoding principles of the coded aperture system.
    • Investigated the effects of sub-aperture manufacturing errors (size, position) and CCD smear noise.
    • Developed strategies to counteract side-effects and enhance decoding wavelength accuracy.

    Main Results:

    • Successfully designed and implemented a coded aperture spectrometer with improved resolution and signal-to-noise ratio.
    • Identified specific side-effects of manufacturing errors on wavelength accuracy.
    • Demonstrated effective methods to minimize these side-effects and improve spectral decoding accuracy.
    • Presented experimental validation of the spectrometer's performance.

    Conclusions:

    • The MEMS-based coded aperture spectrometer offers a significant advancement over traditional designs.
    • Addressing manufacturing errors is crucial for achieving high wavelength accuracy.
    • The developed mitigation techniques enable reliable high-performance spectral measurements.