Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Reflectivity of sputter-deposited gold coatings depending on the layer structure.

Applied optics·2026
Same author

Acupuncture as an Adjunct to Physiotherapy in Post-Stroke Spastic Hand: Comparative Case Series Analysis.

Cureus·2026
Same author

Retrospective cohort study on Shufeng Jiedu granules for SARS-CoV-2 infection: Real-world evidence from multicenter outpatient clinics in a predominantly caucasian population.

Chinese herbal medicines·2026
Same author

Optical interference coatings: measurement challenge 2025 [Invited].

Applied optics·2026
Same author

Optical losses in SiN<sub>x</sub> and SiO<sub>x</sub>N<sub>y</sub> coatings deposited by plasma-enhanced chemical vapor deposition for gravitational wave detectors.

Applied optics·2026
Same author

Ignition of a large stationary natural gas engine by high-peak power passively Q-switched Nd:YAG/Cr<sup>4+</sup>:YAG laser spark plugs.

Optics express·2025
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Related Experiment Video

Updated: May 7, 2026

Scattering And Absorption of Light in Planetary Regoliths
11:34

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

Evaluation of subsurface damage by light scattering techniques.

Marcus Trost, Tobias Herffurth, David Schmitz

    Applied Optics
    |October 3, 2013
    PubMed
    Summary
    This summary is machine-generated.

    Subsurface damage in optical components can limit performance. This study characterizes subsurface damage using light scattering and microscopy, linking scattering results to material properties for better optical component design.

    More Related Videos

    Measuring Spatially- and Directionally-varying Light Scattering from Biological Material
    11:57

    Measuring Spatially- and Directionally-varying Light Scattering from Biological Material

    Published on: May 20, 2013

    Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses
    06:55

    Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

    Published on: June 6, 2017

    Related Experiment Videos

    Last Updated: May 7, 2026

    Scattering And Absorption of Light in Planetary Regoliths
    11:34

    Scattering And Absorption of Light in Planetary Regoliths

    Published on: July 1, 2019

    Measuring Spatially- and Directionally-varying Light Scattering from Biological Material
    11:57

    Measuring Spatially- and Directionally-varying Light Scattering from Biological Material

    Published on: May 20, 2013

    Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses
    06:55

    Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

    Published on: June 6, 2017

    Area of Science:

    • Materials Science
    • Optical Engineering
    • Surface Science

    Background:

    • Subsurface damage (SSD) is an unavoidable consequence of grinding and polishing optical components.
    • SSD can significantly limit the performance of optical components, especially in high-power laser applications or where extreme material strength is required.

    Purpose of the Study:

    • To characterize subsurface damage in ground and polished optical surfaces.
    • To investigate the effectiveness of light scattering techniques for SSD assessment across different spectral ranges.
    • To correlate scattering measurements with established destructive SSD characterization methods.

    Main Methods:

    • Light scattering measurements were performed in the visible and extreme ultraviolet (EUV) spectral ranges.
    • Materials analyzed include fused silica, borosilicate glass, and calcium fluoride.
    • Scattering data was compared with results from white light interferometry, optical microscopy, and atomic force microscopy (AFM) on etched and fractured samples.

    Main Results:

    • Light scattering techniques provide a viable method for characterizing subsurface damage in optical materials.
    • The study established direct links between scattering measurements and topography/cross-section analyses of SSD.
    • Different optical materials exhibit distinct scattering signatures related to their subsurface damage.

    Conclusions:

    • Light scattering offers a non-destructive or minimally destructive approach for SSD evaluation in optical components.
    • Characterizing SSD is crucial for optimizing optical component manufacturing and ensuring performance in demanding applications.
    • The findings support the use of light scattering as a complementary tool to traditional methods for SSD analysis.