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Ultralow-loss silicon waveguide crossing using Bloch modes in index-engineered cascaded multimode-interference
Optics Letters
|October 10, 2013
Summary
Compact silicon waveguide crossings achieve ultra-low insertion loss (<0.01 dB) using novel multimode-interference couplers and subwavelength nanostructures for broadband operation.
Area of Science:
- Photonics and Optical Engineering
- Integrated Optics
- Nanophotonics
Background:
- Multimode-interference (MMI) couplers are essential components in integrated photonic circuits.
- Waveguide crossings are critical for dense circuit layouts but often suffer from high insertion loss.
- Reducing insertion loss in waveguide crossings is key for developing compact and efficient photonic devices.
Purpose of the Study:
- To investigate the loss mechanisms in three-moded MMI couplers.
- To propose and demonstrate a compact and low-loss waveguide crossing structure using cascaded MMI couplers.
- To minimize insertion loss in broadband silicon waveguide crossing arrays.
Main Methods:
- Design and fabrication of a 101x101 waveguide crossing array using cascaded MMI couplers.
- Integration of lateral subwavelength nanostructures to reduce insertion loss.
- Experimental characterization of insertion loss, crosstalk, and transmission spectrum.
Main Results:
- Demonstrated broadband silicon waveguide crossing arrays with insertion loss as low as ~0.02 dB per crossing.
- Achieved crosstalk below -40 dB at a 1550 nm operating wavelength.
- Exhibited a broad transmission spectrum from 1520 to 1610 nm.
Conclusions:
- The proposed MMI coupler-based waveguide crossing structure offers a viable solution for compact and low-loss integrated photonic circuits.
- Subwavelength nanostructures effectively reduce insertion loss in waveguide crossings.
- The demonstrated performance enables advanced photonic integrated circuit designs with improved efficiency.

