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Full-field Strain Measurements for Microstructurally Small Fatigue Crack Propagation Using Digital Image Correlation Method
Published on: January 16, 2019
Yue Fan1, Yuri N Osetskiy, Sidney Yip
1Department of Nuclear Science and Engineering and Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139.
This study introduces a new atomistic method to simulate how dislocations interact with defects at various strain rates. The approach reveals a unique mechanism for defect absorption, enabling dislocation climb and offering insights into material behavior under stress.
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